Agilent Announces New Nanoindentation Technique for Thin Film Materials
Agilent Technologies has just developed a novel nanoindentation technique that gives researchers the unprecedented ability to make substrate-independent measurements on thin film materials quickly, easily, and confidently. Supported exclusively by the Agilent NanoIndenter G200 instrumentation platform, the new technique is ideal for evaluating the elastic modulus of hard films on soft substrates, or soft films on hard substrates.
As the world's most accurate, flexible, and user-friendly instrument for nanoscale mechanical testing, the G200 utilizes electromagnetic actuation to achieve unparalleled dynamic range in force and displacement. The G200 enables measurement of Young's modulus and hardness in full compliance with ISO 14577, as well as measurement of deformation over six orders of magnitude (from nanometers to millimeters).
For more information about the G200 and Agilent's new technique for substrate-independent measurements, please call your local sales representative or email NIO-Sales@agilent.com.
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